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VLT interferometer upgrade for the 2nd generation of interferometric instruments
Authors: Gonté, F.; Woillez, J.; Schuhler, N.; Egner, S.; Merand, A.; Abad, J. A.; Abadie, S.; Abuter, R.; Acuña, M.; Allouche, F.; Alonso, J.; Andolfalto, L.; Antonelli, P.; Avila, G.; Barriga, P. J.; Beltran, J.; Berger, J.-P.; Bolados, C.; Bonnet, H.; Bourget, P.; Brast, R.; Bristow, P.; Caniguante, L.; Castillo, R.; Conzelmann, R.; Cortes, A.; Delplancke, F.; Del Valle, D.; Derie, F.; Diaz, A.; Donoso, R.; Dorn, R.; Duhoux, P.; Dupuy, C.; Eisenhauer, F.; Elao, C.; Fuenteseca, E.; Fernandez, R.; Gaytan, D.; Glindemann, A.; Gonzales, J.; Guieu, S.; Guisard, S.; Haguenauer, P.; Haimerl, A.; Heinz, V.; Henriquez, J. P.; van der Heyden, P.; Hubin, N.; Huerta, R.; Jochum, L.; Leiva, A.; Lévêque, S.; Lizon, J.-L.; Luco, F.; Mardones, P.; Mellado, A.; Osorio, J.; Ott, J.; Pallanca, L.; Pavez, M.; Pasquini, L.; Percheron, I.; Pirard, J.-F.; Than Phan, D.; Pineda, J. C.; Pino, A.; Poupar, S.; Ramírez, A.; Reinero, C.; Riquelme, M.; Romero, J.; Rivinius, T.; Rojas, C.; Rozas, F.; Salgado, F.; Scheithauer, S.; Schmid, C.; Schöller, M.; Siclari, W.; Stephan, C.; Tamblay, R.; Tapia, M.; Tristram, K.; Valdes, G.; de Wit, W.-J.; Wright, A.; Zins, G.
Place of Publication: Bellingham, Wash.
Publisher: SPIE
Date of Publication (YYYY-MM-DD): 2016
Document Type: Other
ID: 731630.0
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