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Entries: 1-10  
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Rapid roughening in thin film growth of an organic semiconductor (diindenoperylene)
Authors: Dürr, A.C.; Schreiber, F.; Ritley, K. A.; Kruppa, V.; Krug, J.; Dosch, H.; Struth, B.
Date of Publication (YYYY-MM-DD): 2003-01-10
Title of Journal: Physical Review Letters
Volume: 90
Issue / Number: 1
Sequence Number of Article: 016104
Document Type: Article
ID: 50933.0
Highly ordered Fe and Nb stripe arrays on facetted α-Al2O3 (1 0 1 0)
Authors: Huth, M.; Ritley, K. A.; Oster, J.; Dosch, H.; Adrian, H.
Date of Publication (YYYY-MM-DD): 2002-05
Title of Journal: Advanced Functional Materials
Volume: 12
Issue / Number: 5
Start Page: 333
End Page: 338
Document Type: Article
ID: 6821.0
 
Full text / Content available
Non-dipolar contributions in XPS detection of X-ray standing waves
Authors: Schreiber, F.; Ritley, K. A.; Vartanyants, I. A.; Dosch, H.; Zegenhagen, J.; Cowie, B. C. C.
Date of Publication (YYYY-MM-DD): 2001-07-10
Title of Journal: Surface Science
Volume: 486
Issue / Number: 3
Start Page: L519
End Page: L523
Document Type: Article
ID: 21077.0
DataScan: An extensible program for image analysis in Java
Authors: Ritley, K. A.; Schlestein, M.; Dosch, H.
Date of Publication (YYYY-MM-DD): 2001-06-15
Title of Journal: Computer Physics Communications
Volume: 137
Issue / Number: 2
Start Page: 300
End Page: 311
Document Type: Article
ID: 21102.0
On the coexistence of different polymorphs in organic epitaxy: α and β phase of PTCDA on Ag(111)
Authors: Krause, B.; Dürr, A. C.; Ritley, K. A.; Schreiber, F.; Dosch, H.; Smilgies, D.
Date of Publication (YYYY-MM-DD): 2001-05-15
Title of Journal: Applied Surface Science
Volume: 175
Start Page: 332
End Page: 336
Document Type: Article
ID: 21394.0
A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements
Authors: Ritley, K. A.; Krause, B.; Schreiber, F.; Dosch, H.
Date of Publication (YYYY-MM-DD): 2001-02
Title of Journal: Review of Scientific Instruments
Volume: 72
Issue / Number: 2
Start Page: 1453
End Page: 1457
Document Type: Article
ID: 21800.0
An X-ray reflectivity study of solution-deposited ZrO2 thin films on SAMs: growth, interface properties, and thermal densification
Authors: Ritley, K. A.; Just, K.-P.; Schreiber, F.; Dosch, H.; Niesen, T. P.; Aldinger, F.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Journal of Materials Research
Volume: 15
Start Page: 2706
End Page: 2713
Document Type: Article
ID: 198986.0
An X-ray reflectivity study of solution-deposited ZrO2 thin films on SAMs: growth, interface properties, and thermal densification
Authors: Ritley, K. A.; Just, K.-P.; Schreiber, F.; Dosch, H.; Niesen, T. P.; Aldinger, F.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Journal of Materials Research
Volume: 15
Start Page: 2706
End Page: 2713
Document Type: Article
ID: 198987.0
Annealing studies of solution-deposited ZrO2 thin films on self-assembled monolayers
Authors: Ritley, K. A.; Schreiber, F.; Just, K.-P.; Dosch, H.; Niesen, T. P.; Aldinger, F.
Place of Publication: Bellingham, Wash.
Date of Publication (YYYY-MM-DD): 2000
Name of Conference/Meeting: 4th International Conference on Thin Films Physics and Applications
Title of Proceedings: 4th International Conference on Thin Films Physics and Applications
Start Page: 414
End Page: 417
Title of Series: Proceedings of SPIE
Volume (in Series): 4086
Document Type: Conference-Paper
ID: 208278.0
Annealing studies of solution-deposited ZrO2 thin films on self-assembled monolayers
Authors: Ritley, K. A.; Schreiber, F.; Just, K.-P.; Dosch, H.; Niesen, T. P.; Aldinger, F.
Place of Publication: Bellingham, Wash.
Date of Publication (YYYY-MM-DD): 2000
Name of Conference/Meeting: 4th International Conference on Thin Films Physics and Applications
Title of Proceedings: 4th International Conference on Thin Films Physics and Applications
Start Page: 414
End Page: 417
Title of Series: Proceedings of SPIE
Volume (in Series): 4086
Document Type: Conference-Paper
ID: 293126.0
Entries: 1-10  
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