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Two-beam cross-correlation: A method to characterize transport phenomena in micrometer-sized structures.
Authors: Brinkmeier, M.; Doerre, K.; Stephan, J.; Eigen, M.
Date of Publication (YYYY-MM-DD): 1999
Title of Journal: Analytical Chemistry
Volume: 71
Start Page: 609
End Page: 616
Document Type: Article
ID: 223387.0
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