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Entries: 1-10  
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Application of microtomography to engineering materials
Authors: Borbély, A.; Dzieciol, K.; Isaac, A.; Sket, F.; Pyzalla, A. R.
(Start) Date of Conference/Meeting
(YYYY-MM-DD): 2008-10-22
Name of Conference/Meeting: Workshop on X-Ray Micro Imaging of Materials, Devices and Organisms
Place of Conference/Meeting: Dresden, Germany
Document Type: Talk at Event
ID: 377686.0
In-Situ Investigation of Creep and Creep Damage Using Synchrotron Microtomography
Authors: Sket, F.; Dzieciol, K.; Isaac, A.; Sauthoff, G.; Borbély, A.; Pyzalla, A. R.
(Start) Date of Conference/Meeting
(YYYY-MM-DD): 2008-10-22
Name of Conference/Meeting: Workshop on X-Ray Micro Imaging of Materials, Devices and Organisms
Place of Conference/Meeting: Dresden, Germany
Document Type: Talk at Event
ID: 380058.0
Tomographic method for the evaluation of activation energy of creep
Authors: Sket, F.; Isaac, A.; Dzieciol, K.; Borbély, A.; Pyzalla, A. R.
(Start) Date of Conference/Meeting
(YYYY-MM-DD): 2008-09-01
Name of Conference/Meeting: MSE08 Materials Science and Engineering
Place of Conference/Meeting: Nürnberg
Document Type: Talk at Event
ID: 374339.0
In-situ synchrotron tomography investigation of creep damage
Authors: Pyzalla, A. R.; Borbély, A.; Isaac, A.; Sket, F.; Dzieciol, K.; di Michiel, M.; Buslaps, T.
(Start) Date of Conference/Meeting
(YYYY-MM-DD): 2008-08-10
Name of Conference/Meeting: SPIE Optics + Photonics 2008
Place of Conference/Meeting: San Diego, CA, USA
Document Type: Talk at Event
ID: 374341.0
In-situ investigation of creep damage using synchrotron X-ray microtomography
Authors: Isaac, A.; Sket, F.; Dzieciol, K.; Sauthoff, G.; Borbély, A.; Pyzalla, A. R.
(Start) Date of Conference/Meeting
(YYYY-MM-DD): 2008-07-25
Name of Conference/Meeting: VIII Simpósio Mecanica Computacional, SIMMEC 2008
Place of Conference/Meeting: Belo Horizonte, Brazil
Document Type: Talk at Event
ID: 374343.0
In-situ microtomographic investigation of creep in leaded brass
Authors: Isaac, A.; Dzieciol, K.; Sket, F.; Borbély, A.; Pyzalla, A. R.
(Start) Date of Conference/Meeting
(YYYY-MM-DD): 2008-05-05
Name of Conference/Meeting: VI-PNAM Symposium
Place of Conference/Meeting: Berlin, Germany
Document Type: Talk at Event
ID: 377685.0
In-situ microtomographic investigation of creep in leaded brass
Authors: Isaac, A.; Dzieciol, K.; Sket, F.; Borbély, A.; Pyzalla, A. R.
(Start) Date of Event
(YYYY-MM-DD): 2008-05-05
Name of Conference/Meeting: VI-PNAM Symposium
Document Type: Poster
ID: 377693.0
In-situ tomographic investigation of brass during high-temperature creep
Authors: Sket, F.; Isaac, A.; Dzieciol, K.; Sauthoff, G.; Borbély, A.; Pyzalla, A. R.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: Scripta Materialia
Volume: 59
Issue / Number: 5
Start Page: 558
End Page: 561
Document Type: Article
ID: 374281.0
Investigation of creep cavity coalescence in brass by in-situ synchrotron X-ray microtomography
Authors: Isaac, A.; Dzieciol, K.; Sket, F.; di Michiel, M.; Buslaps, T.; Borbély, A.; Pyzalla, A. R.
Place of Publication: Bellingham, WA, USA
Publisher: SPIE
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: SPIE Optics + Photonics 2008
Title of Proceedings: Proceedings - Spie the International Society for Optical Engineering
Volume (in Series): 7078 1J
Document Type: Conference-Paper
ID: 378860.0
In-situ Characterisation of Creep Damage Evolution in Metallic Materials using Synchrotron Tomography
Authors: Pyzalla, A. R.; Isaac, A.; Sket, F.; Dzieciol, K.; Sauthoff, G.; Borbély, A.
(Start) Date of Conference/Meeting
(YYYY-MM-DD): 2007-12-04
Name of Conference/Meeting: Symposium "Microstructural Characterisation down to the Atomic Scale"
Place of Conference/Meeting: Leoben / Österreich
Document Type: Talk at Event
ID: 324451.0
Entries: 1-10  
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