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Towards quantification of the In-distribution in InGaAs quantum dots.
Authors: Blank, H.; Litviniv, D.; Schneider, R.; Gerthsen, D.; Passow, T.; Scheerschmidt, K.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Microscopy and Microanalysis
Volume: 13
Issue / Number: 3
Start Page: 318
End Page: 319
Document Type: Article
ID: 350152.0
Sigma-bond expression for an analytic bond-order potential: Including Pi and on-site terms in the fourth moment.
Authors: Kuhlmann, V.; Scheerschmidt, K.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Physical Review B
Volume: 76
Issue / Number: 1
Sequence Number of Article: 014306/1-8
Document Type: Article
ID: 350898.0
A relativistic formalism and the small angle approximation of elastic electron scattering in TEM
Authors: Rother, A.; Scheerschmidt, K.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Microscopy and Microanalysis
Volume: 13
Issue / Number: 3
Start Page: 40
End Page: 41
Document Type: Article
ID: 352213.0
Relaxation of semiconductor nanostructures using molecular dynamics with analytic bond order potentials
Authors: Scheerschmidt, K.; Kuhlmann, V.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: International Journal of Materials Research
Volume: 98
Issue / Number: 11
Start Page: 1081
End Page: 1085
Document Type: Article
ID: 352221.0
Substitution of atomic scattering amplitudes in TEM interpretation by analytic bond order potentials
Authors: Scheerschmidt, K.; Kuhlmann, V.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Microscopy and Microanalysis
Volume: 13
Issue / Number: 3
Start Page: 22
End Page: 23
Document Type: Article
ID: 352222.0
Electron microscope object reconstruction: Condence criteria of inverse solutions
Authors: Scheerschmidt, K.; Rother, A.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Microscopy and Microanalysis
Volume: 13
Issue / Number: 3
Start Page: 140
End Page: 141
Document Type: Article
ID: 352224.0
Bonded semiconductor interfaces with twist and tilt rotation: TEM analysis supported by molecular dynamics structure modeling
Authors: Wilhelm, T.; Kuhlmann, V.; Scheerschmidt, K.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Physica Status Solidi C
Volume: 4
Issue / Number: 8
Start Page: 3115
End Page: 3119
Document Type: Article
ID: 352451.0
Bond order potentials to include charge densities in TEM image
interpretation
Authors: Scheerschmidt, K.; Kuhlmann, V.
Place of Publication: Vienna, Austria
Date of Publication (YYYY-MM-DD): 2006
Title of Proceedings: Proceedings International Conference on Density Functional Theory
and Transmission Electron Microscopy (DFTEM2006)
Start Page: 167
End Page: 170
Document Type: Conference-Paper
ID: 312913.0
Computer-aided TEM analysis of precipitates in GaAs crystals
Authors: Kirmse, H.; Häusler, I.; Hähnert, I.; Neumann, W.; Scheerschmidt, K.; Kiessling, F. M.; Rudolph, P.
Place of Publication: Sapporo, Japan
Date of Publication (YYYY-MM-DD): 2006
Title of Proceedings: Proceedings 16th International Microscopy Congress
Start Page: 1448
Document Type: Conference-Paper
ID: 312910.0
Electron imaging based on charge density potentials and frozen lattices
Authors: Scheerschmidt, K.; Kuhlmann, V.; Rother, A.; Gemming, S.
Place of Publication: Sapporo, Japan
Date of Publication (YYYY-MM-DD): 2006
Title of Proceedings: Proceedings 16th International Microscopy Congress
Start Page: 739
Document Type: Conference-Paper
ID: 312912.0
Entries: 1-10  
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