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Entries: 1-5  
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Multiple ionization of neon by soft x-rays at ultrahigh intensity
Authors: Guichard, R.; Richter, M.; Rost, J. M.; Saalmann, U.; Sorokin, A. A.; Tiedtke, K.
Date of Publication (YYYY-MM-DD): 2013-08-28
Title of Journal: Journal of Physics B- Atomic Molecular and Optical Physics
Volume: 46
Issue / Number: 16 Sp. Iss. SI
Sequence Number of Article: 164025
Document Type: Article
ID: 676882.0
Non-linear processes in the interaction of atoms and molecules with intense EUV and X-ray fields from SASE free electron lasers (FELs)
Authors: Berrah, N.; Bozek, J.; Costello, J. T.; Düsterer, S.; Fang, L.; Feldhaus, J.; Fukuzawa, H.; Hoener, M.; Jiang, Y. H.; Johnsson, P.; Kennedy, E. T.; Meyer, M.; Moshammer, R.; Radcliffe, P.; Richter, M.; Rouzee, A.; Rudenko, A.; Sorokin, A. A.; Tiedtke, K.; Ueda, K.; Ullrich, J.; Vrakking, M. J. J.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Journal of Modern Optics
Volume: 57
Issue / Number: 12
Start Page: 1015
End Page: 1040
Document Type: Article
ID: 521737.0
Experiments at FLASH
Authors: Bostedt, C.; Chapman, H. N.; Costello, J. T.; Crespo López-Urrutia, J. R.; Düsterer, S.; Epp, S. W.; Feldhaus, J.; Föhlisch, A.; Meyer, M.; Möller, T.; Moshammer, R.; Richter, M.; Sokolowski-Tinten, K.; Sorokin, A.; Tiedtke, K.; Ullrich, J.; Wurth, W.
Date of Publication (YYYY-MM-DD): 2009-01
Title of Journal: Nuclear Instruments and Methods in Physics Research A
Volume: 601
Issue / Number: 1-2
Start Page: 108
End Page: 122
Document Type: Article
ID: 441462.0
Photoelectron spectroscopy as a non-invasive method to monitor SASE-FEL spectra
Authors: Wellhöfer, M.; Hoeft, Jon Tobias; Martins, M.; Wurth, W.; Braune, Markus; Viefhaus, Jens; Tiedtke, K.; Richter, M.
Date of Publication (YYYY-MM-DD): 2008-02-08
Title of Journal: Journal of Instrumentation
Volume: 3
Start Page: 02003-1
End Page: 02003-13
Document Type: Article
ID: 401014.0
Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids
Authors: Chalupsky, J.; Juha, L.; Kuba, J.; Cihelka, J.; Hajkova, V.; Koptyaev, S.; Krasa, J.; Velyhan, A.; Bergh, M.; Caleman, C.; Hajdu, J.; Bionta, R. M.; Chapman, H.; Hau-Riege, S. P.; London, R. A.; Jurek, M.; Krzywinski, J.; Nietubyc, R.; Pelka, J. B.; Sobierajski, R.; Meyer-ter-Vehn, Jürgen; Tronnier, Annika; Sokolowski-Tinten, K.; Stojanovic, N.; Tiedtke, K.; Toleikis, S.; Tschentscher, T.; Wabnitz, H.; Zastrau, U.
Date of Publication (YYYY-MM-DD): 2007-05-14
Title of Journal: Optics Express
Volume: 15
Issue / Number: 10
Start Page: 6036
End Page: 6043
Document Type: Article
ID: 317357.0
 
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