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The importance of grain boundaries for the time-dependent mobility degradation in organic thin-film transistors
Authors: Weitz, R. T.; Amsharov, K.; Zschieschang, U.; Burghard, M.; Jansen, M.; Kelsch, M.; Rhamati, B.; van Aken, P. A.; Kern, K.; Klauk, H.
Date of Publication (YYYY-MM-DD): 2009-10-27
Title of Journal: Chemistry of Materials
Volume: 21
Issue / Number: 20
Start Page: 4949
End Page: 4954
Document Type: Article
ID: 438378.0
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