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Transport properties and defects in silicon nanoparticles and effect of embedding in amorphous silicon layers
Authors: Gueunier-Farret, M. E.; Kleider, J. P.; Voigt, F.; Brüggemann, R.; Bauer, G. H.; Huisken, F.; Ledoux, G.
Date of Publication (YYYY-MM-DD): 2006
Volume: 352
Start Page: 1101
End Page: 1104
Document Type: Article
ID: 308738.0
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