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Measuring electrostatic potential profiles across amorphous intergranular films by electron diffraction
Authors: Koch, C. T.; Bhattacharyya, S.; Rühle, M.; Satet, R.; Hoffmann, M. J.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Microscopy and Microanalysis
Volume: 12
Start Page: 160
End Page: 169
Document Type: Article
ID: 282009.0
Measuring electrostatic potential profiles across amorphous intergranular films by electron diffraction
Authors: Koch, C. T.; Bhattacharyya, S.; Rühle, M.; Satet, R.; Hoffmann, M. J.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Microscopy and Microanalysis
Volume: 12
Start Page: 160
End Page: 169
Document Type: Article
ID: 292956.0
Preparation and microstructural analysis of high-performance ceramics
Authors: Täffner, U.; Carle, V.; Schäfer, U.; Hoffmann, M. J.
Title of Book: Metallography and Microstructures
Start Page: 1057
End Page: 1066
Place of Publication: Materials Park, OH
Publisher: ASM International
Date of Publication (YYYY-MM-DD): 2004
Document Type: InBook
ID: 241127.0
Solubility of Si3N4 in liquid SiO2
Authors: Gu, H.; Cannon, R. M.; Seifert, H. J.; Hoffmann, M. J.; Tanaka, I.
Date of Publication (YYYY-MM-DD): 2002-01
Title of Journal: Journal of the American Ceramic Society
Volume: 85
Issue / Number: 1
Start Page: 25
End Page: 32
Document Type: Article
ID: 6964.0
Adsorption and wetting mechanisms at ceramic grain boundaries
Authors: Cannon, R. M.; Rühle, M.; Hoffmann, M. J.; French, R. H.; Gu, H.; Tomsia, A. P.; Saiz, E.
Title of Book: Grain Boundary Engineering in Ceramics
Start Page: 427
End Page: 444
Place of Publication: Westerville/OH
Publisher: American Ceramic Society
Date of Publication (YYYY-MM-DD): 2000
Document Type: InBook
ID: 198942.0
Entries: 1-5  
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