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Polarity determination of a GaN thin film on sapphire (0001) with X-ray standing waves.
Authors: Kazimirov, A.; Scherb, G.; Zegenhagen, J.; Lee, T. L.; Bedzyk, M. J.; Kelly, M. K.; Angerer, H.; Ambacher, O.
Date of Publication (YYYY-MM-DD): 1998
Title of Journal: Journal of Applied Physics
Volume: 84
Start Page: 1703
End Page: 1705
Document Type: Article
ID: 182216.0
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