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Electron microscopy study of advanced heterostructures for optoelectronics
Authors: Katcki, J.; Ratajczak, J.; Phillipp, F.; Muszalski, J.; Bugajski, M.; Chen, J. X.; Fiore, A.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Materials Chemistry and Physics
Volume: 81
Issue / Number: 2-3
Start Page: 244
End Page: 248
Document Type: Article
ID: 48890.0
Electron microscopy study of vertical cavity surface emitting lasers
Authors: Katcki, J.; Ratajczak, J.; Phillipp, F.; Bugajski, M.; Muszalski, J.
Place of Publication: Bristol
Publisher: IOP Publishing Ltd.
Date of Publication (YYYY-MM-DD): 2001
Name of Conference/Meeting: Microscopy of Semiconducting Materials
Title of Proceedings: Microscopy of Semiconducting Materials 2001. Proceedings of the Royal Microscopical Society Conference
Start Page: 493
End Page: 496
Title of Series: Institute of Physics Conference Series
Volume (in Series): 169
Document Type: Conference-Paper
ID: 24326.0
Entries: 1-2  
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