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Entries: 1-3  
Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films
Authors: Abou-Ras, D.; Caballero, R.; Fischer, C.-H.; Kaufmann, C.; Lauermann, I.; Mainz, R.; Mönig, H.; Schöpke, A.; Stephan, C.; Streeck, C.; Schorr, S.; Eicke, A.; Döbeli, M.; Gade, B.; Hinrichs, J.; Nunney, T.; Dijkstra, H.; Hoffmann, V.; Klemm, D.; Efimova, V.; Bergmaier, A.; Dollinger, G.; Wirth, T.; Unger, W.; Rockett, A. A.; Perez Rodriguez, A.; Alvarez Garcia, J.; Izquierdo-Roca, V.; Schmid, T.; Choi, P.; Müller, M.; Bertram, F.; Christen, J.; Khatri, H.; Collins, R. W.; Marsillac, S.; Kötschau, I.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Microscopy and Microanalysis
Volume: 17
Start Page: 728
End Page: 751
Document Type: Article
ID: 624666.0
Al-Cr-O Thin Films as an Efficient Hydrogen Permeation Barrier
Authors: Ramm, J.; Levchuk, D.; Bolt, H.; Döbeli, M.; Eggenberger, S.; Widrig, B.
(Start) Date of Conference/Meeting
Name of Conference/Meeting: 11th International Conference on Plasma Surface Engineering (PSE 2008)
Place of Conference/Meeting: Garmisch-Partenkirchen
Document Type: Talk at Event
ID: 667619.0
Al-Cr-O thin films as an efficient hydrogen barrier
Authors: Levchuk, D.; Bolt, H.; Döbeli, M.; Eggenberger, S.; Widrig, B.; Ramm, J.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: Surface and Coatings Technology
Volume: 202
Issue / Number: 20
Start Page: 5043
End Page: 5047
Document Type: Article
ID: 376486.0
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Entries: 1-3  
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