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SrBi2Nb2O9 thin films epitaxially grown on Pt epitaxial bottom layers: structural characteristics and nanoscale characterization of the ferroelectric behaviour by AFM
Authors: Duclère, J. R.; Guilloux-Viry, M.; Bouquet, V.; Perrin, A.; Gautier, B.
Date of Publication (YYYY-MM-DD): 2004
Title of Journal: Annalen der Physik
Volume: 13
Issue / Number: 1-2
Start Page: 35
End Page: 38
Document Type: Article
ID: 192706.0
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