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Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers
Authors: Meduňa, M.; Holý, V.; Stangl, J.; Hesse, A.; Roch, T.; Bauer, G.; Schmidt, O. G.; Eberl, K.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Physica E
Volume: 13
Issue / Number: 2-4
Start Page: 1003
End Page: 1007
Document Type: Article
ID: 7153.0
Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
Authors: Meduňa, M.; Holý, V.; Roch, T.; Bauer, G.; Schmidt, O. G.; Eberl, K.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Semiconductor Science and Technology
Volume: 17
Issue / Number: 5
Start Page: 480
End Page: 486
Document Type: Article
ID: 7285.0
X-ray reflectivity from self-assembled structures in Ge/Si superlattices
Authors: Meduňa, M.; Holý, V.; Roch, T.; Bauer, G.; Schmidt, O. G.; Eberl, K.
Date of Publication (YYYY-MM-DD): 2001
Title of Journal: Journal of Physics D
Volume: 34
Start Page: A193
End Page: A196
Document Type: Article
ID: 181941.0
Entries: 1-3  
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