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Entries: 1-10  
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Effect of peat quality on microbial greenhouse gas formation in an acidic fen
Authors: Reiche, M.; Gleixner, Gerd; Kusel, K.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Biogeosciences
Volume: 7
Start Page: 187
End Page: 198
Document Type: Article
ID: 548869.0
Fabrication, characterization and modeling of strained SOI MOSFETs with very large effective mobility.
Authors: Driussi, F.; Esseni, D.; Selmi, L.; Schmidt, M.; Lemme, M. C.; Kurz, H.; Buca, D.; Mantl, S.; Luysberg, M.; Loo, R.; Nguyen, D.; Reiche, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Proceedings: Proceedings of the 37th European Solid-State Device Reseach Conference (ESSDERC 2007)
Start Page: 315
End Page: 318
Document Type: Conference-Paper
ID: 350320.0
Uniaxially strained silicon by wafer bonding and layer transfer.
Authors: Himcinschi, C.; Radu, I.; Muster, F.; Singh, R.; Reiche, M.; Petzold, M.; Gösele, U.; Christiansen, S. H.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Solid State Electronics
Volume: 51
Issue / Number: 2
Start Page: 226
End Page: 230
Document Type: Article
ID: 350460.0
Compressive uniaxially strained silicon on insulator by prestrained wafer bonding and layer transfer.
Authors: Himcinschi, C.; Reiche, M.; Scholz, R.; Christiansen, S. H.; Gösele, U.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Applied Physics Letters
Volume: 90
Issue / Number: 23
Sequence Number of Article: 231909
Document Type: Article
ID: 350461.0
Strain relaxation in nanopatterned strained silicon round pillars.
Authors: Himcinschi, C.; Singh, R.; Radu, I.; Milenin, A. P.; Erfurth, W.; Reiche, M.; Gösele, U.; Christiansen, S. H.; Muster, F.; Petzold, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Applied Physics Letters
Volume: 90
Issue / Number: 2
Sequence Number of Article: 021902/1-3
Document Type: Article
ID: 350463.0
Silicon nanostructures for IR light emitters.
Authors: Kittler, M.; Arguirov, T.; Yu, X.; Jia, G.; Vyvenko, O. F.; Mchedlidze, T.; Reiche, M.; Sha, J.; Yang, D.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Materials Science & Engineering C
Volume: 27
Start Page: 1252
End Page: 1259
Document Type: Article
ID: 350522.0
Regular dislocation networks in silicon as a tool for nanostructure devices used in optics, biology, and electronics.
Authors: Kittler, M.; Yu, X.; Mchedlidze, T.; Arguirov, T.; Vyvenko, O. F.; Seifert, W.; Reiche, M.; Wilhelm, T.; Seibt, M.; Voß, O.; Wolff, A.; Fritzsche, W.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Small
Volume: 3
Issue / Number: 6
Start Page: 964
End Page: 973
Document Type: Article
ID: 350542.0
Scanning probe studies of the electrical activity at interfaces formed by silicon wafer direct bonding
Authors: Ratzke, M.; Vyvenko, O. F.; Yu, X.; Reif, J.; Kittler, M.; Reiche, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Physica Status Solidi C
Volume: 4
Issue / Number: 8
Start Page: 2893
End Page: 2897
Document Type: Article
ID: 352207.0
Strained Silicon-On-Insulator - Fabrication and characterization
Authors: Reiche, M.; Himcinschi, C.; Gösele, U.; Christiansen, S. H.; Mantl, S.; Buca, D.; Zhao, Q. T.; Feste, S.; Loo, R.; Nguyen, D.; Buchholtz, W.; Wei, A.; Horstmann, M.; Feijoo, D.; Storck, P.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: ECS Transactions
Volume: 6
Issue / Number: 4
Start Page: 339
End Page: 344
Document Type: Article
ID: 352208.0
High-density-plasma (HDP)-CVD oxide to thermal oxide wafer bonding for strained silicon layer transfer applications
Authors: Singh, R.; Radu, I.; Reiche, M.; Himcinschi, C.; Kuck, B.; Tillack, B.; Gösele, U.; Christiansen, S. H.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Applied Surface Science
Volume: 253
Start Page: 3595
End Page: 3599
Document Type: Article
ID: 352265.0
Entries: 1-10  
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