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Entries: 1-3  
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Regular dislocation networks in silicon as a tool for nanostructure devices used in optics, biology, and electronics.
Authors: Kittler, M.; Yu, X.; Mchedlidze, T.; Arguirov, T.; Vyvenko, O. F.; Seifert, W.; Reiche, M.; Wilhelm, T.; Seibt, M.; Voß, O.; Wolff, A.; Fritzsche, W.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Small
Volume: 3
Issue / Number: 6
Start Page: 964
End Page: 973
Document Type: Article
ID: 350542.0
Self-organized pattern formation of biomolecules at silicon surfaces:
Intended application of a dislocation network
Authors: Kittler, M.; Yu, X.; Vyvenko, O. F.; Birkholz, M.; Seifert, W.; Reiche, M.; Wilhelm, T.; Arguirov, T.; Wolff, A.; Fritzsche, W.; Seibt, M.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Materials Science & Engineering C
Volume: 26
Issue / Number: 5-7
Start Page: 902
End Page: 910
Document Type: Article
ID: 312787.0
Atomic structure of the interface between silicon (111) and amorphous germanium
Authors: Borgardt, N. I.; Plikat, B.; Schröter, W.; Seibt, M.; Wagner, T.
Date of Publication (YYYY-MM-DD): 2004-11
Title of Journal: Physical Review B
Volume: 70
Issue / Number: 19
Sequence Number of Article: 195307
Document Type: Article
ID: 211362.0
Entries: 1-3  
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