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High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)
Authors: Martin, N. M.; Knudsen, J.; Blomberg, S.; Gustafson, J.; Andersen, J. N.; Ingelsten, H.; Carlsson, P.-A.; Skoglundh, M.; Stierle, A.; Kresse, G.
Date of Publication (YYYY-MM-DD): 2011-03-22
Title of Journal: Physical Review B
Volume: 83
Sequence Number of Article: 125417
Document Type: Article
ID: 563154.0
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