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Cross-sectional TEM study on metal/carbon nanotube interface
Authors: Jin-Phillipp, N.Y.; Kelsch, M.; Sycha, M.; Thomas, J.; Rühle, M.
Place of Publication: New York, USA
Publisher: Press Syndicate of the University of Cambridge
Date of Publication (YYYY-MM-DD): 2004-08
Name of Conference/Meeting: Microscopy and Microanalysis 2004
Title of Proceedings: Proceedings Microscopy and Microanalysis 2004, Suppl. 2
Start Page: 280CD
End Page: 281CD
Document Type: Conference-Paper
ID: 194925.0
Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning
Authors: Strecker, A.; Bäder, U.; Kelsch, M.; Salzberger, U.; Sycha, M.; Gao, M.; Richter, G.; van Benthem, K.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Zeitschrift für Metallkunde
Volume: 94
Start Page: 290
End Page: 297
Document Type: Article
ID: 200435.0
Entries: 1-2  
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