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Photoelectron spectroscopy as a non-invasive method to monitor SASE-FEL spectra
Authors: Wellhöfer, M.; Hoeft, Jon Tobias; Martins, M.; Wurth, W.; Braune, Markus; Viefhaus, Jens; Tiedtke, K.; Richter, M.
Date of Publication (YYYY-MM-DD): 2008-02-08
Title of Journal: Journal of Instrumentation
Volume: 3
Start Page: 02003-1
End Page: 02003-13
Document Type: Article
ID: 401014.0
Soft X-ray laser spectroscopy on trapped highly charged ions at FLASH
Authors: Epp, S. W.; Crespo López-Urrutia, J. R.; Brenner, G.; Mäckel, V.; Mokler, P. H.; Treusch, R.; Kuhlmann, M.; Yurkov, M. V.; Feldhaus, J.; Schneider, J. R.; Wellhöfer, M.; Martins, M.; Wurth, W.; Ullrich, J.
Date of Publication (YYYY-MM-DD): 2007-05-04
Title of Journal: Physical Review Letters
Volume: 98
Issue / Number: 18
Sequence Number of Article: 183001
Document Type: Article
ID: 336338.0
Laser spectroscopy on trapped highly-charged ions using soft x-rays from FLASH
Authors: Epp, S. W.; Crespo López-Urrutia, J. R.; Brenner, G.; Mäckel, V.; Mokler, P.; Treusch, R.; Kuhlmann, M.; Yurkov, M. V.; Feldhaus, J.; Schneider, J. R.; Wellhöfer, M.; Martins, M.; Wurth, W.; Ullrich, J.
Date of Publication (YYYY-MM-DD): 2007
Name of Conference/Meeting: XXV INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS
Title of Journal: Journal of Physics: Conference Series
Volume (in Journal): 88
Sequence Number: 012059
Document Type: Conference-Paper
ID: 336982.0
Entries: 1-3  
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