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Unsupervised classification of single−particle X−ray diffraction snapshots by spectral clustering
Authors: Yoon, Chun Hong; Schwander, Peter; Abergel, Chantal; Andersson, Inger; Andreasson, Jakob; Aquila, Andrew; Bajt, Saša; Barthelmess, Miriam; Barty, Anton; Bogan, Michael J.; Bostedt, Christoph; Bozek, John; Chapman, Henry N.; Claverie, Jean−Michel; Coppola, Nicola; DePonte, Daniel P.; Ekeberg,, Tomas; Epp, Sascha W.; Erk, Benjamin; Fleckenstein, Holger; Foucar, Lutz; Graafsma, Heinz; Gumprecht, Lars; Hajdu, Janos; Hampton, Christina Y.; Hartmann, Andreas; Hartmann, Elisabeth; Hartmann, Robert; Hauser, Gunter; Hirsemann, Helmut; Holl, Peter; Kassemeyer, Stephan; Kimmel, Nils; Kiskinova, Maya; Liang, Mengning; Loh, Ne−Te Duane; Lomb, Lukas; Maia, Filipe R. N. C.; Martin, Andrew V.; Nass, Karol; Pedersoli, Emanuele; Reich, Christian; Rolles, Daniel; Rudek, Benedikt; Rudenko, Artem; Schlichting, Ilme; Schulz, Joachim; Seibert, Marvin; Seltzer, Virginie; Shoeman, Robert L.; Sierra, Raymond G.; Soltau, Heike; Starodub, Dmitri; Steinbrener, Jan; Stier, Gunter; Strüder, Lothar; Svenda, Martin; Ullrich, Joachim; Weidenspointner, Georg; White, Thomas A.; Wunderer, Cornelia; Ourmazd, Abbas
Date of Publication (YYYY-MM-DD): 2011-08-15
Title of Journal: Optics Express
Volume: 19
Issue / Number: 17
Start Page: 16542
End Page: 16549
Document Type: Article
ID: 597758.0
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