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Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications
Authors: Ratajczak, J.; Łaszcz, A.; Czerwinski, A.; Katcki, J.; Phillipp, F.; van Aken, P. A.; Reckinger, N.; Dupois, E.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy
Title of Journal: Journal of Microscopy
Volume (in Journal): 237
Issue / Number: 3
Start Page: 379
End Page: 383
Document Type: Conference-Paper
ID: 458868.0
Characterization of ytterbium silicide formed in ultra high vacuum
Authors: Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: 16th International Conference on Microscopy of Semiconducting Materials
Title of Journal: Journal of Physics: Conference Series
Volume (in Journal): 209
Sequence Number: 012056
Document Type: Conference-Paper
ID: 466661.0
HRTEM characterization of erbium silicide formed in ultra-high vacuum
Authors: Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
Place of Publication: Graz
Publisher: Verlag der Technischen Universität Graz, Austria
Date of Publication (YYYY-MM-DD): 2009
Name of Conference/Meeting: MC2009, Microscopy Conference
Title of Proceedings: MC2009. Vol. 3: Materials Science
Start Page: 31
End Page: 32
Document Type: Conference-Paper
ID: 435835.0
Entries: 1-3  
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