Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Display Documents


Institute:
Collection:
Print in Citation style Print version     Display:
Sort by: Display records with Fulltext only
Entries: 1-7  
 Basket 
Silicon nanostructures for IR light emitters.
Authors: Kittler, M.; Arguirov, T.; Yu, X.; Jia, G.; Vyvenko, O. F.; Mchedlidze, T.; Reiche, M.; Sha, J.; Yang, D.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Materials Science & Engineering C
Volume: 27
Start Page: 1252
End Page: 1259
Document Type: Article
ID: 350522.0
Regular dislocation networks in silicon as a tool for nanostructure devices used in optics, biology, and electronics.
Authors: Kittler, M.; Yu, X.; Mchedlidze, T.; Arguirov, T.; Vyvenko, O. F.; Seifert, W.; Reiche, M.; Wilhelm, T.; Seibt, M.; Voß, O.; Wolff, A.; Fritzsche, W.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Small
Volume: 3
Issue / Number: 6
Start Page: 964
End Page: 973
Document Type: Article
ID: 350542.0
Scanning probe studies of the electrical activity at interfaces formed by silicon wafer direct bonding
Authors: Ratzke, M.; Vyvenko, O. F.; Yu, X.; Reif, J.; Kittler, M.; Reiche, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Physica Status Solidi C
Volume: 4
Issue / Number: 8
Start Page: 2893
End Page: 2897
Document Type: Article
ID: 352207.0
Luminescence of dislocation network in directly bonded silicon wafers
Authors: Yu, X.; Kittler, M.; Vyvenko, O. F.; Seifert, W.; Arguirov, T.; Wilhelm, T.; Reiche, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Physica Status Solidi C
Volume: 4
Issue / Number: 8
Start Page: 3025
End Page: 3029
Document Type: Article
ID: 352458.0
Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bonding
Authors: Yu, X.; Vyvenko, O. F.; Kittler, M.; Seifert, W.; Mchedlidze, T.; Arguirov, T.; Reiche, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Semiconductors
Volume: 41
Issue / Number: 4
Start Page: 458
End Page: 461
Document Type: Article
ID: 352459.0
Enhancement of IR emission from a dislocation network in Si due to an external bias voltage
Authors: Yu, X.; Vyvenko, O. F.; Reiche, M.; Kittler, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Materials Science & Engineering C
Volume: 27
Start Page: 1026
End Page: 1029
Document Type: Article
ID: 352460.0
Self-organized pattern formation of biomolecules at silicon surfaces:
Intended application of a dislocation network
Authors: Kittler, M.; Yu, X.; Vyvenko, O. F.; Birkholz, M.; Seifert, W.; Reiche, M.; Wilhelm, T.; Arguirov, T.; Wolff, A.; Fritzsche, W.; Seibt, M.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Materials Science & Engineering C
Volume: 26
Issue / Number: 5-7
Start Page: 902
End Page: 910
Document Type: Article
ID: 312787.0
Entries: 1-7  
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.