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Entries: 1-5  
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Use of scanning capacitance microscopy for controlling wafer processing
Authors: Jeandupeux, O.; Marsico, V.; Acovic, A.; Fazan, P.; Brune, H.; Kern, K.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Microelectronics Reliability
Volume: 42
Issue / Number: 2
Start Page: 225
End Page: 231
Document Type: Article
ID: 7357.0
Building supramolecular nanostructures at surfaces by hydrogen bonding
Authors: Barth, J. V.; Weckesser, J.; Cai, C. Z.; Günter, P.; Bürgi, L.; Jeandupeux, O.; Kern, K.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Angewandte Chemie International Edition
Volume: 39
Start Page: 1230
End Page: 1234
Document Type: Article
ID: 181319.0
Quantum coherence and lifetimes of surface-state electrons
Authors: Bürgi, L.; Brune, H.; Jeandupeux, O.; Kern, K.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Journal of Electron Spectroscopy and Related Phenomena
Volume: 109
Start Page: 33
End Page: 49
Document Type: Article
ID: 181365.0
Probing hot-electron dynamics at surfaces with a cold scanning tunneling microscope.
Authors: Bürgi, L.; Jeandupeux, O.; Brune, H.; Kern, K.
Date of Publication (YYYY-MM-DD): 1999
Title of Journal: Physical Review Letters
Volume: 82
Start Page: 4516
End Page: 4519
Document Type: Article
ID: 180595.0
Thermal damping of quantum interference patterns of surface-state electrons.
Authors: Jeandupeux, O.; Bürgi, L.; Hirstein, A.; Brune, H.; Kern, K.
Date of Publication (YYYY-MM-DD): 1999
Title of Journal: Physical Review B
Volume: 59
Start Page: 15926
End Page: 15933
Document Type: Article
ID: 180780.0
Entries: 1-5  
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