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Use of scanning capacitance microscopy for controlling wafer processing |
Authors: Jeandupeux, O.; Marsico, V.; Acovic, A.; Fazan, P.; Brune, H.; Kern, K. | Date of Publication (YYYY-MM-DD): 2002 | Title of Journal: Microelectronics Reliability | Volume: 42 | Issue / Number: 2 | Start Page: 225 | End Page: 231 | Document Type: Article | ID: 7357.0 |
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Quantum coherence and lifetimes of surface-state electrons |
Authors: Bürgi, L.; Brune, H.; Jeandupeux, O.; Kern, K. | Date of Publication (YYYY-MM-DD): 2000 | Title of Journal: Journal of Electron Spectroscopy and Related Phenomena | Volume: 109 | Start Page: 33 | End Page: 49 | Document Type: Article | ID: 181365.0 |
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Probing hot-electron dynamics at surfaces with a cold scanning tunneling microscope. |
Authors: Bürgi, L.; Jeandupeux, O.; Brune, H.; Kern, K. | Date of Publication (YYYY-MM-DD): 1999 | Title of Journal: Physical Review Letters | Volume: 82 | Start Page: 4516 | End Page: 4519 | Document Type: Article | ID: 180595.0 |
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Thermal damping of quantum interference patterns of surface-state electrons. |
Authors: Jeandupeux, O.; Bürgi, L.; Hirstein, A.; Brune, H.; Kern, K. | Date of Publication (YYYY-MM-DD): 1999 | Title of Journal: Physical Review B | Volume: 59 | Start Page: 15926 | End Page: 15933 | Document Type: Article | ID: 180780.0 |
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