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Advanced Calculations for Defects in Materials: Electronic Structure Methods |
Editors: Alkauskas, A.; Deak, P.; Neugebauer, J.; Pasquarello, A.; van de Walle, C. G. | Place of Publication: Weinheim, Germany | Publisher: WILEY-VCH Verlag GmbH & Co. KGaA | Date of Publication (YYYY-MM-DD): 2011-06-18 | Physical Description (e.g. Total Number of Pages): 384 | Document Type: Book | ID: 626167.0 |
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Advanced Calculations for Defects in Solids - Electronic Structure Methods - Preface |
Editors: Alkauskas, A.; Deak, P.; Neugebauer, J.; Pasquarello, A.; van de Walle, C. G. | Title of Journal: Physica Status Solidi B | Volume: 248 | Issue / Number: 1 | Place of Publication: Weinheim, Germany | Publisher: WILEY-VCH Verlag GmbH & Co. KGaA | Date of Publication (YYYY-MM-DD): 2011-01-12 | Document Type: Issue | ID: 626164.0 |
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Mapping and identification of essential gene functions on the X chromosome of Drosophila |
Authors: Peter, A.; Schoettler, P.; Werner, M.; Beinert, N.; Dowe, G.; Burkert, P.; Mourkioti, F.; Dentzer, L.; He, Y. C.; Deak, P.; Benos, P. V.; Gatt, M. K.; Murphy, L.; Harris, D.; Barrell, B.; Ferraz, C.; Vidal, S.; Brun, C.; Demailles, J.; Cadieu, E.; Dreano, S.; Gloux, S.; Lelaure, V.; Mottier, S.; Galibert, F.; Borkova, D.; Minana, B.; Kafatos, F. C.; Bolshakov, S.; Siden-Kiamos, I.; Papagiannakis, G.; Spanos, L.; Louis, C.; Madueno, E.; de Pablos, B.; Modolell, J.; Bucheton, A.; Callister, D.; Campbell, L.; Henderson, N. S.; McMillan, P. J.; Salles, C.; Tait, E.; Valenti, P.; Saunders, R. D. C.; Billaud, A.; Pachter, L.; Klapper, R.; Janning, W.; Glover, D. M.; Ashburner, M.; Bellen, H. J.; Jaeckle, H.; Schaefer, U. | Date of Publication (YYYY-MM-DD): 2002-01 | Title of Journal: EMBO Reports | Volume: 3 | Issue / Number: 1 | Start Page: 34 | End Page: 38 | Document Type: Article | ID: 16941.0 |
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