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Entries: 1-4  
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Diamond and nitride imagers for UV observation of the sun
Authors: Hochedez, J. F.; Appourchaux, T.; Belsky, A.; Castex, M. C.; Deneuville, A.; Dhez, P.; Fleck, B.; Hainaut, O.; Idir, M.; Kleider, J. P.; Lemaire, P.; Monroy, E.; Munoz, E.; Muret, P.; Nesladek, M.; Omnes, F.; Pau, J.; Peacock, A.; Schühle, U.; Van Hoof, C.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: J. de Phys. IV
Volume: 108
Issue / Number: 13
Start Page: 227
End Page: 231
Document Type: Article
ID: 176656.0
New UV detectors for solar observations: recent progresses
Authors: Hochedez, J.-F.; Schühle, U.; Pau, J. L.; Alvarez, J.; Hainaut, O.; Appourchaux, T.; Auret, D. F.; Belsky, A.; Bergonzo, P.; Castex, M.-C.; Deneuville, A.; Dhez, P.; Fleck, B.; Haenen, K.; Idir, M.; Kleider, J.-P.; Lefeuvre, E.; Lemaire, P.; Monroy, E.; Muret, P.; Munoz, E.; Nesladek, M.; Omnes, F.; Pace, E.; Peacock, A.; Van Hoof, C.
Date of Publication (YYYY-MM-DD): 2003
Title of Proceedings: Innovative Telescopes and Instrumentation for Solar Astrophysics
Start Page: 419
End Page: 426
Document Type: Conference-Paper
ID: 176580.0
The quantum efficiency of the XMM pn-CCD camera
Authors: Hartmann, R.; Hartner, G.; Briel, U. G.; Dennerl, K.; Haberl, F.; Strüder, L.; Trümper, J.; Bihler, E.; Kendziorra, E.; Hochedez, J.-F.; Jourdain, E.; Dhez, P.; Salvetat, Ph.; Auerhammer, J.; Schmitz, D.; Scholze, F.; Ulm, G.
Place of Publication: Bellingham, Wash., USA
Publisher: Society of Photo-Optical Instrumentation Engineers
Date of Publication (YYYY-MM-DD): 1999
Name of Conference/Meeting: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X
Title of Proceedings: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X
Start Page: 703
End Page: 713
Title of Series: Proceedings of SPIE
Volume (in Series): 3765
Document Type: Conference-Paper
ID: 294768.0
The EPIC system onboard the ESA XMM mission
Authors: Villa, G. E.; Abbey, A. F.; Arnaud, M.; Balasini, M.; Bignami, G. F.; Boer, M.; Bräuninger, H.; Butler, I.; Cafagna, G.; Cara, C.; Chabaud, C.; Chiappetti, L.; Cole, R.; Conte, M.; Dowson, J.; Dhez, P.; Duc, R.; Di Cocco, G.; Ferrando, P.; Goodall, C. V.; Hippmann, H.; Holland, A.; Kendziorra, E.; Labeque, A.; Meidinger, N.; Moriggio, C.; La Palombara, N.; Musso, C.; Poindron, E.; Peres, G.; Pfeffermann, E.; Pigot, C.; Pye, J. P.; Reppin, C.; Schmitt, D.; Sciortino, S.; Serio, S.; Spragg, J.; Stephen, J. B.; Strüder, L.; Trifoglio, M.; Tua, P.; Turner, M. J. L.; Whitehead, S.
Place of Publication: Bellingham, Wash.
Publisher: SPIE - The International Society for Optical Engineering
Date of Publication (YYYY-MM-DD): 1996
Name of Conference/Meeting: EUV, X-ray, and Gamma-ray Instrumentation for Astronomy VII
Title of Proceedings: EUV, X-ray, and Gamma-ray Instrumentation for Astronomy VII
Start Page: 402
End Page: 413
Title of Series: SPIE Proceedings Series
Volume (in Series): 2808
Document Type: Conference-Paper
ID: 316622.0
 
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