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Entries: 1-4  
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Band offsets at zincblende-wurtzite GaAs nanowire sidewall surfaces
Authors: Capiod, P.; Xu, T.; Nys, J. P.; Berthe, M.; Patriarche, G.; Lymperakis, L.; Neugebauer, J.; Caroff, P.; Dunin-Borkowski, R. E.; Ebert, P.; Grandidier, B.
Date of Publication (YYYY-MM-DD): 2013-09-18
Title of Journal: Applied Physics Letters
Volume: 103
Issue / Number: Applied Physics Letters
Start Page: 122104-1
End Page: 122104-4
Document Type: Article
ID: 671095.0
Revealing Hidden Surface States of Non-Polar GaN Facets by an Ab Initio Tailored STM Approach
Authors: Lymperakis, L.; Weidlich, P. H.; Eisele, H.; Schnedler, M.; Nys, J.-P.; Grandidier, B.; Stievenard, D.; Dunin-Borkowski, R.; Neugebauer, J.; Ebert, P.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2013-08-25
Name of Conference/Meeting: 10th International Conference on Nitride Semiconductors
Place of Conference/Meeting: Washigton DC, USA
Document Type: Talk at Event
ID: 671097.0
Manganese adlayers on i-Al-Pd-Mn quasicrystal: growth and electronic structure
Authors: Shukla, A. K.; Dhaka, R. S.; D’Souza, S. W.; Maniraj, M.; Barman, Sudipto Roy; Horn, Karsten; Ebert, P.; Urban, K.; Wu, D.; Lograsso, T. A.
Date of Publication (YYYY-MM-DD): 2009-10-07
Title of Journal: Journal of Physics Condensed Matter
Volume: 21
Start Page: 405005-1
End Page: 405005-8
Document Type: Article
ID: 446688.0
How to improve quality assurance in fluorometry : fluorescence-inherent sources of error and suited fluorescence standards
Authors: Resch-Genger, U.; Hoffmann, K.; Nietfeld, W.; Engel, A.; Neukammer, J.; Nitschke, R.; Ebert, P.; Macdonald, R.
Date of Publication (YYYY-MM-DD): 2005-05
Title of Journal: Journal of Fluorescence
Volume: 15
Issue / Number: 3
Start Page: 337
End Page: 362
Document Type: Article
ID: 273092.0
 
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