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Progress on the development of a Cc/Cs corrector for TEAM
Authors: Haider, M.; Hartel, P.; Löbau, U.; Höschen, R.; Müller, H.; Uhlemann, S.; Kahl, F.; Zach, J.
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: Microscopy and Microanalysis 2008
Title of Journal: Microscopy and Microanalysis
Volume (in Journal): 14
Issue / Number: Supplement S2
Start Page: 800CD
End Page: 801CD
Document Type: Conference-Paper
ID: 372671.0
Concept and design of the SMART spectromicroscope at BESSY II
Editors: Thieme, Jürgen; Schmahl, Günter; Rudolph, Dietbert; Umbach, Eberhard
Authors: Engel, W.; Degenhardt, Ralf; Bradshaw, Alexander M.; Erlebach, Wolfgang; Ihmann, Klaus; Kuhlenbeck, Helmut; Wichtendahl, R.; Freund, Hans-Joachim; Schlögl, Robert; Preikszas, D.; Rose, H.; Spehr, R.; Hartel, P.; Lilienkamp, G.; Schmidt, T.; Bauer, E.; Benner, G.; Fink, R.; Weiss, M. R.; Umbach, Eberhard
Title of Book: X-Ray Microscopy and Spectromicroscopy
Start Page: III-55
End Page: III-66
Place of Publication: Berlin [et al.]
Publisher: Springer
Date of Publication (YYYY-MM-DD): 1998
Document Type: InBook
ID: 2015.0
Entries: 1-2  
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