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A DEPFET Based Beam Telescope with Submicron Precision Capability
Authors: Velthuis, J. J.; Drasal, Z.; Hanninger, G.; Kohrs, R.; Mathes, M.; Reuen, L.; Scheireich, D.; Andricek, L.; Pascual, I. C.; Chen, X.; Dolezal, Z.; Fischer, P.; Frey, A.; Fuster, J. A.; Koch, M.; Kodys, P.; Kvasnicka, P.; Krueger, H.; Llacer, C. L.; Lodomez, P.; Moser, H. G.; Peric, I.; Raspereza, A.; Richter, R.; Rummel, S.; von Toerne, E.; Wermes, N.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: IEEE Transactions on Nuclear Science
Issue / Number: 55
Start Page: 662
End Page: 666
Document Type: Conference-Paper
ID: 543289.0
DEPFET Active Pixel Detectors
Authors: Moser, H. -G.; Andricek, L.; Chen, X.; Frey, A.; Lutz, G.; Richter, R. H.; Schnecke, M.; Raspereza, A.; Rummel, S.; Feld, L.; Jussen, R.; Karpinski, W.; Hettkamp, P.; Kohrs, R.; Karagounis, M.; Koch, M.; Krueger, H.; Lodomez, P.; Mathes, M.; Reuen, L.; Sandow, C.; Schneider, J.; von Toerne, E.; Trimpl, M.; Velthuis, J.; Wermes, N.; de Boer, W.; Bol, J.; Sabellek, A.; Fischer, P.; Giesen, G.; Kreidel, C.; Peric, I.; Treis, J.; Schopper, F.; Strueder, L.; Dolezal, Z.; Drasal, Z.; Kodys, P.; Kvasnicka, P.; Scheirich, D.; Carbonell, I.; Fuster, J.; Lacasta, C.; Marinas, C.; Vos, M.
Document Type: Conference-Paper
ID: 544442.0
Entries: 1-2  
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