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Resolution enhancement by subtraction of confocal signals taken at different pinhole sizes
Authors: Heintzmann, R.; Sarafis, V.; Munroe, P.; Nailon, J.; Hanley, Q. S.; Jovin, T. M.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Micron
Volume: 34
Start Page: 293
End Page: 300
Document Type: Article
ID: 42767.0
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