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Random projection for dimensionality reductionApplied to time-of-flight secondary ion mass spectrometry data
Authors: Varmuza, Kurt; Engrand, Cécile; Filzmoser, Peter; Hilchenbach, Martin; Kissel, Jochen; Krüger, Harald; Silén, Johan; Trieloff, Mario
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Analytica Chimica Acta
Volume: 705
Start Page: 48
End Page: 55
Document Type: Article
ID: 583871.0
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