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Entries: 1-4  
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Screening in two dimensions: GW calculations for surfaces and thin films using the repeated-slab approach
Authors: Freysoldt, Christoph; Eggert, Philipp; Rinke, Patrick; Schindlmayr, Arno; Scheffler, Matthias
Date of Publication (YYYY-MM-DD): 2008-06-19
Title of Journal: Physical Review B
Volume: 77
Issue / Number: 23
Start Page: 235428-1
End Page: 235428-11
Document Type: Article
ID: 360759.0
 
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Dielectric anisotropy in the GW space-time method
Authors: Freysoldt, Christoph; Eggert, Philipp; Rinke, Patrick; Schindlmayr, Arno; Godby, R. W.; Scheffler, Matthias
Date of Publication (YYYY-MM-DD): 2007-01-01
Title of Journal: Computer Physics Communications
Volume: 176
Issue / Number: 1
Start Page: 1
End Page: 13
Document Type: Article
ID: 285084.0
 
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Theoretische Untersuchung von Vielteilcheneffekten auf Silizium-Halbleiteroberflächen
Authors: Eggert, Philipp
Name of University: Freie Universität Berlin
Place of University: Berlin
Date of Approval (YYYY-MM-DD): 2005-11-21
Document Type: PhD-Thesis
ID: 248738.0
 
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Selbstenergierechnungen an der Si(001)-Oberfläche
Authors: Eggert, Philipp
Type of Thesis (e.g.Diploma): diplom
Date of Approval (YYYY-MM-DD): 2001
Name of University: FU
Place of University: Berlin
Document Type: Thesis
ID: 2582.1
Entries: 1-4  
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