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Double aberration correction in a low-energy electron microscope
Authors: Schmidt, Thomas; Marchetto, Helder; Lévesque, Pierre L.; Groh, Ulli; Maier, Florian; Preikszas, Dirk; Hartel, Peter; Spehr, Rainer; Lilienkamp, Gerhard; Engel, Wilfried; Fink, Rainer; Bauer, Ernst; Rose, Harald; Umbach, Eberhard; Freund, Hans-Joachim
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Ultramicroscopy
Volume: 110
Issue / Number: 11
Start Page: 1358
End Page: 1361
Document Type: Article
ID: 442817.0
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