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Entries: 1-10  
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Monitoring surface ion mobility on aluminum oxide: Effect of chemical pretreatments
Authors: Salgin, B.; Hamou, R. F.; Rohwerder, M.
Date of Publication (YYYY-MM-DD): 2013-03-20
Title of Journal: Electrochimica Acta
Volume: 110
Start Page: 526
End Page: 533
Document Type: Article
ID: 670320.0
Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy
Authors: Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.
Date of Publication (YYYY-MM-DD): 2010-06-15
Title of Journal: Electrochim. Acta
Volume: 55
Issue / Number: 18
Start Page: 5210
End Page: 5222
Document Type: Article
ID: 476016.1
Numerical Investigation of Electrode Surface Potential Mapping with Scanning Electrochemical Potential Microscopy
Authors: Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2010-05-09
Name of Conference/Meeting: The 12th International Scanning Probe Microscopy Conference
Place of Conference/Meeting: Sapporo, Japan
Document Type: Talk at Event
ID: 476018.0
Numerical simulation of probing the electric double layer by scanning electrochemical Potential microscopy
Authors: Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2010-04-25
Name of Conference/Meeting: 217th ECS Meeting
Place of Conference/Meeting: Vancouver, Canada
Document Type: Talk at Event
ID: 476017.0
SECPM Study: Influence of the Tip Material and Its Coating on the Accuracy of Potential Profiling Across Electrical Double Layer at Solid/Liquid Interface
Authors: Bashir, A.; Muglali, M. I.; Hamou, R. F.; Rohwerder, M.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2010-04-25
Name of Conference/Meeting: 217th ECS Meeting
Place of Conference/Meeting: Vancouver, Canada
Document Type: Talk at Event
ID: 476019.0
Numerical analysis of Debye screening effect in electrode surface potential mapping by scanning electrochemical potential microscopy
Authors: Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Electrochemistry Communications
Volume: 12
Start Page: 1391
End Page: 1394
Document Type: Article
ID: 494256.0
Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy
Authors: Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2009-11-01
Name of Conference/Meeting: International Workshops on Surface Modification for Chemical and Biochemical Sensing
Place of Conference/Meeting: Przegorzaly, Poland
Document Type: Talk at Event
ID: 446613.0
Screening effects in probing the double layer by scanning electrochemical potential microscopy
Authors: Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2009-10-01
Name of Conference/Meeting: Comsol European Conference October 2009
Place of Conference/Meeting: Milan, Italy
Document Type: Talk at Event
ID: 446608.0
Screening effects in probing the double layer by scanning electrochemical potential microscopy
Authors: Hamou, R. F.; Erbe, A.; Rohwerder, M.
(Start) Date of Event
(YYYY-MM-DD):
 2009-10-01
Name of Conference/Meeting: Comsol European Conference October 2009
Document Type: Poster
ID: 450852.0
Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM)
Authors: Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2009-07-01
Name of Conference/Meeting: 11th International Fischer Symposium on Microscopy in Electrochemistry
Place of Conference/Meeting: Benediktbeuern, Germany
Document Type: Talk at Event
ID: 446606.0
Entries: 1-10  
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