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Entries: 1-9  
Synthesis of diamond fine particles on levitated seed particles in an rf CH4/H2 plasma chamber equipped with a hot filament
Authors: Shimizu, S.; Shimizu, T.; Thomas, H. M.; Matern, G.; Stark, R. W.; Balden, M.; Lindig, S.; Watanabe, Y.; Jacob, W.; Sato, N.; Morfill, G. E.
Date of Publication (YYYY-MM-DD): 2012
Title of Journal: Journal of Applied Physics
Volume: 112
Sequence Number of Article: 073303 (4pp)
Document Type: Article
ID: 610299.0
Full text / Content available
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy
Authors: Gigler, A. M.; Huber, A. J.; Bauer, M.; Ziegler, A.; Hillenbrand, R.; Stark, R. W.
Date of Publication (YYYY-MM-DD): 2009-12-07
Title of Journal: Optics Express
Volume: 17
Issue / Number: 25
Start Page: 22351
End Page: 22357
Document Type: Article
ID: 442248.0
The approach to diamond growth on the levitated seed particles
Authors: Shimizu, S.; Shimizu, T.; Annaratone, B. M.; Jacob, W.; Linsmeier, C.; Lindig, S.; Stark, R. W.; Jamitzky, F.; Thomas, H.; Sato, N.; Morfill, G. E.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Applied Surface Science
Volume: 254
Start Page: 177
End Page: 180
Document Type: Article
ID: 298121.0
Full text / Content available
Chaos in dynamic atomic force microscopy
Authors: Jamitzky, F.; Stark, M.; Bunk, W.; Heckl, W. M.; Stark, R. W.
Date of Publication (YYYY-MM-DD): 2006-04-14
Name of Conference/Meeting: 8th International Conference on Non-Contact Atomic Force Microscopy
Title of Journal: Nanotechnology
Volume (in Journal): 17
Issue / Number: 7
Start Page: S213
End Page: S220
Document Type: Conference-Paper
ID: 275539.0
Full text / Content available
Estimating the transfer function of the cantilever in atomic force microscopy: A system identification approach
Authors: Stark, M.; Guckenberger, R.; Stemmer, A.; Stark, R. W.
Date of Publication (YYYY-MM-DD): 2005-12-01
Title of Journal: Journal of Applied Physics
Volume: 98
Issue / Number: 11
Sequence Number of Article: 114904
Document Type: Article
ID: 256590.0
Bayesian reconstruction of surface roughness and depth profiles
Authors: Mayer, M.; Fischer, R.; Lindig, S.; von Toussaint, U.; Stark, R. W.; Dose, V.
Date of Publication (YYYY-MM-DD): 2005
Title of Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume: 228
Start Page: 349
End Page: 359
Document Type: Article
ID: 200297.0
Full text / Content available
State-space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy
Authors: Stark, R. W.; Schitter, G.; Stark, M.; Guckenberger, R.; Stemmer, A.
Date of Publication (YYYY-MM-DD): 2004-02
Title of Journal: Physical Review B
Volume: 69
Issue / Number: 8
Sequence Number of Article: 085412
Document Type: Article
ID: 221893.0
Inverting dynamic force microscopy: From signals to time- resolved interaction forces
Authors: Stark, M.; Stark, R. W.; Heckl, W. M.; Guckenberger, R.
Date of Publication (YYYY-MM-DD): 2002-06-25
Title of Journal: Proceedings of the National Academy of Sciences of the United States of America
Volume: 99
Issue / Number: 13
Start Page: 8473
End Page: 8478
Document Type: Article
ID: 31400.0
Spectroscopy of the anharmonic cantilever oscillations in tapping-mode atomic-force microscopy
Authors: Stark, M.; Stark, R. W.; Heckl, W. M.; Guckenberger, R.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Applied Physics Letters
Volume: 77
Issue / Number: 20
Start Page: 3293
End Page: 3295
Document Type: Article
ID: 318563.0
Entries: 1-9  
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