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Entries: 1-7  
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Insight into the physics of Fe-pnictides from optical and T = 0 penetration depth data
Authors: Drechsler, S.-L.; Roth, F.; Grobosch, M.; Schuster, R.; Koepernik, K.; Rosner, H.; Behr, G.; Rotter, M.; Johrendt, D.; Büchner, B.; Knupfer, M.
Date of Publication (YYYY-MM-DD): 2010-01-01
Name of Conference/Meeting: 9th International Conference on Materials and Mechanisms of Superconductivity
Title of Journal: Physica C
Volume (in Journal): 470
Issue / Number: Supplement 1
Start Page: S332
End Page: S333
Document Type: Conference-Paper
ID: 522659.0
Pseudogap and charge density waves in two dimensions
Authors: Borisenko, S. V.; Kordyuk, A. A.; Yaresko, A. N.; Zabolotnyy, V. B.; Inosov, D. S.; Schuster, R.; Büchner, B.; Weber, R.; Follath, R.; Patthey, L.; Berger, H.
Date of Publication (YYYY-MM-DD): 2008-05-16
Title of Journal: Physical Review Letters
Volume: 100
Issue / Number: 19
Sequence Number of Article: 196402
Document Type: Article
ID: 402240.0
Extent of Protection, Art. 69 EPC and Interpretation
Protocol
Authors: Pagenberg, J.; Schuster, R.
Title of Book: Concise European Patent Law
Start Page: 78
End Page: 87
Place of Publication: Alphen
Publisher: Kluwer Law International
Date of Publication (YYYY-MM-DD): 2008
Document Type: InBook
ID: 427176.0
The microstructure and state of stress of Sn thin films after post-plating annealing; an explanation for the suppression of whisker formation?
Authors: Sobiech, M.; Welzel, U.; Schuster, R.; Mittemeijer, E. J.; Hügel, W.; Seekamp, A.; Müller, V.
Place of Publication: Piscataway, NJ
Publisher: IEEE Service Center
Date of Publication (YYYY-MM-DD): 2007
Name of Conference/Meeting: 57th IEEE Electronic Components and Technology Conference
Title of Proceedings: 2007 IEEE Electronic Components & Technology Conference, ECTC '07. Proceedings
Start Page: 192
End Page: 197
Document Type: Conference-Paper
ID: 319234.0
 
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Extent of Protection, Art. 69 EPC and the Protocol on the Interpretation of Art. 69 of the Convention
Authors: Pagenberg, J.; Schuster, R.
Title of Book: Concise European Patent Law
Start Page: 73
End Page: 81
Place of Publication: Alphen
Publisher: Kluwer Law International
Date of Publication (YYYY-MM-DD): 2007
Document Type: InBook
ID: 344339.0
Whiskerbildung im System Kupfer-Zinn
Authors: Schuster, R.
Type of Thesis (e.g.Diploma): diplom
Date of Approval (YYYY-MM-DD): 2006-02-28
Name of University: Universität Stuttgart
Place of University: Stuttgart
Document Type: Thesis
ID: 286645.0
Scanning-tunneling-microscope imaging of clean and alkali-metal-covered Cu(110) and Au(110)surfaces
Authors: Doyen, G.; Drakova, D.; Barth, J. V.; Schuster, R.; Gritsch, T.; Behm, R. J.; Ertl, G.
Date of Publication (YYYY-MM-DD): 1993
Title of Journal: Physical Review B
Volume: 48
Start Page: 1738
End Page: 1749
Document Type: Article
ID: 2150.1
 
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Entries: 1-7  
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