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Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids
Authors: Chalupsky, J.; Juha, L.; Kuba, J.; Cihelka, J.; Hajkova, V.; Koptyaev, S.; Krasa, J.; Velyhan, A.; Bergh, M.; Caleman, C.; Hajdu, J.; Bionta, R. M.; Chapman, H.; Hau-Riege, S. P.; London, R. A.; Jurek, M.; Krzywinski, J.; Nietubyc, R.; Pelka, J. B.; Sobierajski, R.; Meyer-ter-Vehn, Jürgen; Tronnier, Annika; Sokolowski-Tinten, K.; Stojanovic, N.; Tiedtke, K.; Toleikis, S.; Tschentscher, T.; Wabnitz, H.; Zastrau, U.
Date of Publication (YYYY-MM-DD): 2007-05-14
Title of Journal: Optics Express
Volume: 15
Issue / Number: 10
Start Page: 6036
End Page: 6043
Document Type: Article
ID: 317357.0
 
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