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Double aberration correction in a low-energy electron microscope
Authors: Schmidt, Thomas; Marchetto, Helder; Lévesque, Pierre L.; Groh, Ulli; Maier, Florian; Preikszas, Dirk; Hartel, Peter; Spehr, Rainer; Lilienkamp, Gerhard; Engel, Wilfried; Fink, Rainer; Bauer, Ernst; Rose, Harald; Umbach, Eberhard; Freund, Hans-Joachim
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Ultramicroscopy
Volume: 110
Issue / Number: 11
Start Page: 1358
End Page: 1361
Document Type: Article
ID: 442817.0
Influence of substrate morphology on organic layer growth: PTCDA on Ag(111)
Authors: Marchetto, Helder; Groh, Ullrich; Schmidt, Thomas; Fink, Rainer; Freund, Hans-Joachim; Umbach, Eberhard
Date of Publication (YYYY-MM-DD): 2006-06-09
Title of Journal: Chemical Physics
Volume: 325
Issue / Number: 1
Start Page: 178
End Page: 184
Document Type: Article
ID: 281442.0
Entries: 1-2  
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