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High-resolution spectroscopy with reciprocal-space analysis: Application to isotopically pure Si
Authors: Yoo, S. D.; Aspnes, D. E.; Lastras-Martínez, L. F.; Ruf, T.; Konuma, M.; Cardona, M.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: physica status solidi (b)
Volume: 220
Start Page: 117
End Page: 125
Document Type: Article
ID: 182048.0
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