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Entries: 1-7  
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Mating system shifts and transposable element evolution in the plant genus Capsella
Authors: Ågren, J. A.; Wang, W.; Koenig, D.; Neuffer, B.; Weigel, D.; Wright, S. I.
Date of Publication (YYYY-MM-DD): 2014
Title of Journal: BMC Genomics
Volume: 15
Start Page: 602
Sequence Number of Article: 25030755
Document Type: Article
ID: 706665.0
Characterization of order domains in γ-TiAl by orientation microscopy based on electron backscatter diffraction
Authors: Zambaldi, C.; Zaefferer, S.; Wright, S. I.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Journal of Applied Crystallography
Volume: 42
Start Page: 1092
End Page: 1101
Document Type: Article
ID: 439331.0
 
Full text / Content available
Determination of Texture and Microstructure of Ordering Domains in gamma-TiAl
Authors: Zambaldi, C.; Wright, S. I.; Zaefferer, S.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2008-06-01
Name of Conference/Meeting: 15th International Conference on the Texture of Materials (ICOTOM 15)
Place of Conference/Meeting: Pittsburgh, PA, USA
Document Type: Talk at Event
ID: 366675.0
Determination of texture and microstructure of ordering domains in gamma-TiAl
Authors: Zambaldi, C.; Zaefferer, S.; Wright, S. I.
(Start) Date of Event
(YYYY-MM-DD):
 2008-03-31
Name of Conference/Meeting: Electron Backscatter Diffraction Meeting by the Royal Microscopical Society
Document Type: Poster
ID: 359773.0
 
Full text / Content available
Three-dimensional orientation microscopy in a focused ion beam-scanning electron microscope: A new dimension of microstructure characterization
Authors: Zaefferer, S.; Wright, S. I.; Raabe, D.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: Metallurgical and Materials Transactions A
Volume: 39A
Issue / Number: 2
Start Page: 374
End Page: 389
Document Type: Article
ID: 357477.0
3D-orientation microscopy in a FIB SEM: A new dimension of microstructure characterisation
Authors: Zaefferer, S.; Wright, S. I.; Raabe, D.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2007-08-07
Name of Conference/Meeting: M&M 2007, Microscopy and Microanalysis 2007 Meeting
Place of Conference/Meeting: Ft. Lauderdale, FL, USA
Document Type: Talk at Event
ID: 379768.0
Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a combined FIB/SEM
Authors: Wright, S. I.; Zaefferer, S.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: GIT Imaging & Microscopy
Volume: 4
Start Page: 40
End Page: 41
Document Type: Article
ID: 379439.0
Entries: 1-7  
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