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A (S)TEM and atom probe tomography study of InGaN
Authors: Mehrtens, T.; Bley, S.; Schowalter, M.; Sebald, K.; Seyfried, M.; Gutowski, J.; Gerstl, S. A.; Choi, P.; Raabe, D.; Rosenauer, A.
Date of Publication (YYYY-MM-DD): 2011
Name of Conference/Meeting: 17th International Conference on Microscopy of Semiconducting Materials 2011
Title of Journal: Journal of Physics, Conference Series
Volume (in Journal): 326
Issue / Number: 012029
Start Page: 1
End Page: 4
Document Type: Conference-Paper
ID: 576294.0
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