Sensitivity study of the SX tomography system on Wendelstein 7-X |
Authors: Thomsen, H.; Bergmann, T.; Biedermann, C.; Dinklage, A.; König, R.; Li, D.; Marquardt, M.; Meisel, F.; Sachtleben, J.; Schülke, M.; Sieber, T.; Svensson, J.; Vorkörper, A.; Weißflog, S.; Weller, A.; Zacharias, D.; Zhang, D. | Place of Publication: Geneva | Publisher: European Physical Society | Date of Publication (YYYY-MM-DD): 2012 | Name of Conference/Meeting: 39th EPS Conference on Plasma Physics and 16th International Congress on Plasma Physics | Title of Proceedings: 39th European Physical Society Conference on Plasma Physics and 16th International Congress on Plasma Physics. Contributed Papers | Sequence Number: P2.011 | Title of Series: ECA | Volume (in Series): 36F | Document Type: Conference-Paper | ID: 624861.0 |
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