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Entries: 1-8  
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Effect of overgrowth on shape, composition, and strain of SiGe islands on Si(001)
Authors: Hesse, A.; Stangl, J.; Holý, V.; Roch, T.; Bauer, G.; Schmidt, O. G.; Denker, U.; Struth, B.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Physical Review B
Volume: 66
Issue / Number: 8
Sequence Number of Article: 085321
Document Type: Article
ID: 7167.0
The thickness dependence of the effect of pressures on magnetic and electronic properties of thin films of La2/3Ca1/3MnO3
Authors: Jacob, S.; Roch, T.; Razavi, F. S.; Gross, G. M.; Habermeier, H.-U.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Journal of Applied Physics
Volume: 91
Issue / Number: 4
Start Page: 2232
End Page: 2235
Document Type: Article
ID: 7420.0
Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers
Authors: Meduňa, M.; Holý, V.; Stangl, J.; Hesse, A.; Roch, T.; Bauer, G.; Schmidt, O. G.; Eberl, K.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Physica E
Volume: 13
Issue / Number: 2-4
Start Page: 1003
End Page: 1007
Document Type: Article
ID: 7153.0
Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
Authors: Meduňa, M.; Holý, V.; Roch, T.; Bauer, G.; Schmidt, O. G.; Eberl, K.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Semiconductor Science and Technology
Volume: 17
Issue / Number: 5
Start Page: 480
End Page: 486
Document Type: Article
ID: 7285.0
Strain and composition distribution in uncapped SiGe islands from x-ray diffraction
Authors: Stangl, J.; Daniel, A.; Holý, V.; Roch, T.; Bauer, G.; Kegel, I.; Metzger, T. H.; Wiebach, T.; Schmidt, O. G.; Eberl, K.
Date of Publication (YYYY-MM-DD): 2001
Title of Journal: Applied Physics Letters
Volume: 79
Start Page: 1474
End Page: 1476
Document Type: Article
ID: 182745.0
X-ray reflectivity from self-assembled structures in Ge/Si superlattices
Authors: Meduňa, M.; Holý, V.; Roch, T.; Bauer, G.; Schmidt, O. G.; Eberl, K.
Date of Publication (YYYY-MM-DD): 2001
Title of Journal: Journal of Physics D
Volume: 34
Start Page: A193
End Page: A196
Document Type: Article
ID: 181941.0
Vertical correlation of SiGe islands in SiGe/Si superlattices: X-ray diffraction versus transmission electron microscopy
Authors: Stangl, J.; Roch, T.; Bauer, G.; Kegel, I.; Metzger, T. H.; Schmidt, O. G.; Eberl, K.; Kienzle, O.; Ernst, F.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Applied Physics Letters
Volume: 77
Start Page: 3953
End Page: 3955
Document Type: Article
ID: 181880.0
Colossal pressure-induced negative resistance change in La2/3Ca1/3MnO3 thin films.
Authors: Roch, T.; Yaghoubzadeh, S.; Razavi, F. S.; Leibold, B.; Praus, R.; Habermeier, H.-U.
Date of Publication (YYYY-MM-DD): 1998
Title of Journal: Applied Physics A
Volume: 67
Start Page: 723
End Page: 725
Document Type: Article
ID: 180367.0
Entries: 1-8  
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