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Entries: 1-4  
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In situ three-dimensional reciprocal-space mapping during mechanical deformation
Authors: Cornelius, T. W.; Davydok, A.; Jacques, V. L. R.; Grifone, R.; Schülli, T.; Richard, M. I.; Beutier, G.; Verdier, M.; Metzger, T. H.; Pietsch, U.; Thomas, O.
Date of Publication (YYYY-MM-DD): 2012-09
Title of Journal: Journal of Synchrotron Radiation
Volume: 19
Start Page: 688
End Page: 694
Document Type: Article
ID: 629244.0
 
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Structural properties of semiconductor nanostructures from x-ray scattering
Authors: Stangl, J.; Schülli, T.; Hesse, A.; Holý, V.; Bauer, G.; Stoffel, M.; Schmidt, O. G.
Date of Publication (YYYY-MM-DD): 2004
Title of Journal: Advances in Solid State Physics
Volume: 44
Start Page: 227
End Page: 240
Document Type: Article
ID: 199196.0
X-ray study of the structure and order in lithographic Cu3Au nano-cuboids
Authors: Schülli, T.; Trenkler, J.; Mönch, I.; Le Bolloc'h, D.; Dosch, H.
Date of Publication (YYYY-MM-DD): 2002-06
Title of Journal: Europhysics Letters
Volume: 58
Issue / Number: 5
Start Page: 737
End Page: 743
Document Type: Article
ID: 6809.0
 
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Laterale Strukturierung und röntgenographische Untersuchung epitaktischer Metallfilme.
Authors: Schülli, T.
Type of Thesis (e.g.Diploma): diplom
Date of Approval (YYYY-MM-DD): 2000-10-31
Name of University: Universität Stuttgart
Place of University: Stuttgart
Document Type: Thesis
ID: 201578.0
Entries: 1-4  
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