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Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up
Authors: Müller-Buschbaum, P.; Casagrande, M.; Gutmann, Jochen S.; Kuhlmann, T.; Stamm, Manfred; von Krosigk, G.; Lode, U.; Cunis, S.; Gehrke, R.
Date of Publication (YYYY-MM-DD): 1998
Title of Journal: Europhysics Letters
Volume: 42
Start Page: 517
End Page: 522
Document Type: Article
ID: 359301.0
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