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Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography |
Authors: Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A. | Date of Publication (YYYY-MM-DD): 2013 | Title of Journal: Applied Physics Letters | Volume: 102 | Issue / Number: 13 | Start Page: 4 pages | Sequence Number of Article: 132112 | Document Type: Article | ID: 668578.0 |
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