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Entries: 1-10  
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Synthesis of V-Doped TiO2 films by chemical bath deposition and the effect of post-annealing on their properties
Authors: Shopova-Gospodinova, D.; Jeurgens, L. P. H.; Welzel, U.; Bauermann, R. C.; Hoffmann, R. C.; Bill, J.
Date of Publication (YYYY-MM-DD): 2012
Title of Journal: Thin Solid Films
Volume: 520
Start Page: 5928
End Page: 5935
Document Type: Article
ID: 611239.0
Stress relaxation mechanisms of Sn and SnPb coatings electrodeposited on Cu: avoidance of whiskering
Authors: Sobiech, M.; Teufel, J.; Welzel, U.; Mittemeijer, E. J.; Hügel, W.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Journal of Electronic Materials
Volume: 40
Issue / Number: 11
Start Page: 2300
End Page: 2313
Document Type: Article
ID: 573305.0
The lattice parameter of nanocrystalline Ni as function of crystallite size
Authors: Sheng, J.; Rane, G.; Welzel, U.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Physica E
Volume: 43
Start Page: 1155
End Page: 1161
Document Type: Article
ID: 579696.0
Stress relaxation mechanisms of Sn and SnPb coatings electrodeposited on Cu: avoidance of whiskering
Authors: Sobiech, M.; Teufel, J.; Welzel, U.; Mittemeijer, E. J.; Hügel, W.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Journal of Electronic Materials
Volume: 40
Start Page: 2300
End Page: 2313
Document Type: Article
ID: 579759.0
Tailoring the stress-depth profile in thin films; the case of γ’-Fe4N1-x
Authors: Wohlschlögel, M.; Welzel, U.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Thin Solid Films
Volume: 520
Start Page: 287
End Page: 293
Document Type: Article
ID: 579761.0
Breakthroughs in understanding elastic grain interaction and whisker formation made possible by advances in X-ray powder diffraction
Authors: Welzel, U.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: International Journal of Materials Research
Volume: 102
Start Page: 846
End Page: 860
Document Type: Article
ID: 579764.0
Phase formation at the Sn/Cu interface during room temperature aging: microstructural evolution, whiskering, and interface thermodynamics
Authors: Sobiech, M.; Krüger, C.; Welzel, U.; Wang, J. Y.; Mittemeijer, E. J.; Hügel, W.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Journal of Materials Research
Volume: 26
Start Page: 1482
End Page: 1493
Document Type: Article
ID: 579766.0
Nanoscale planar faulting in nanocrystalline Ni-W thin films: grain growth, segregation, and residual stress
Authors: Welzel, U.; Kümmel, J.; Bischoff, E.; Kurz, S.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Journal of Materials Research
Volume: 26
Start Page: 2558
End Page: 2573
Document Type: Article
ID: 579768.0
Proceedings of the Twelfth European Powder Diffraction Conference
Editors: Fuess, H.; Scardi, P.; Welzel, U.
Place of Publication: München
Publisher: Odenbourg Wissenschaftverlag
Date of Publication (YYYY-MM-DD): 2011
Physical Description
(e.g. Total Number of Pages):
 492 S.
Title of Series: Zeitschrift für Kristallographie Proceedings
Volume (in Series or Journal): 1
Document Type: Proceedings
ID: 579771.0
Diffraction analysis of grain growth in nanocrystalline Ni-W powders prepared by mechanical milling
Authors: Rane, G. K.; Apel, D.; Welzel, U.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Zeitschrift für Kristallographie Proc. 1
Volume: 1
Start Page: 247
End Page: 252
Document Type: Article
ID: 579772.0
Entries: 1-10  
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