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Femtosecond free−electron laser x−ray diffraction
data sets for algorithm development
Authors: Kassemeyer, Stephan; Steinbrener, Jan; Lomb, Lukas; Hartmann, Elisabeth; Aquila, Andrew; Barty, Anton; Martin, Andrew V.; Hampton, Christina Y.; Bajt, Saša; Barthelmess, Miriam; Barends, Thomas; Bostedt, Christoph; Bott, Mario; Bozek, John D.; Coppola, Nicola; Cryle, Max; DePonte, Daniel P.; Doak, R. Bruce; Epp, Sascha W.; Erk, Benjamin; Fleckenstein, Holger; Foucar, Lutz; Graafsma, Heinz; Gumprecht, Lars; Hartmann, Andreas; Hartmann, Robert; Hauser, Günter; Hirsemann, Helmut; Hömke, André; Holl, Peter; Jönsson, Olof; Kimmel, Nils; Krasniqi, Faton; Liang, Mengning; Maia, Filipe R.N.C.; Marchesini, Stefano; Nass, Karol; Reich, Christian; Rolles, Daniel; Rudek, Benedikt; Rudenko, Artem; Schmidt, Carlo; Schulz, Joachim; Shoeman, Robert L.; Sierra, Raymond G.; Soltau, Heike; Spence, John C. H.; Starodub, Dmitri; Stellato, Francesco; Stern, Stephan; Stier, Gunter; Svenda, Martin; Weidenspointner, Georg; Weierstall, Uwe; White, Thomas A.; Wunderer, Cornelia B.; Frank, Matthias; Chapman, Henry N.; Joachim, Ullrich; Strüder, Lothar; Bogan, Michael J.; Schlichting, Ilme
Date of Publication (YYYY-MM-DD): 2012-02-13
Title of Journal: Optics Express
Volume: 20
Issue / Number: 4
Start Page: 4149
End Page: 4158
Document Type: Article
ID: 638121.0
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