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Entries: 1-10  
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Characterization of strained semiconductor structures using transmission electron microscopy
Authors: Özdöl, V. B.
Name of University: Christian-Abrechts-Universität zu Kiel
Place of University: Kiel
Date of Approval (YYYY-MM-DD): 2011-07-25
Document Type: PhD-Thesis
ID: 580542.0
The Stuttgart Center for Electron Microscopy at the Max Planck Institute for Metals Research
Authors: van Aken, P. A.; Jin-Phillipp, N. Y.; Koch, C. T.; Ögüt, B.; Özdöl, V. B.; Phillipp, F.; Rahmati, B.; Sigle, W.; Srot, V.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: International Journal of Materials Research
Volume: 102
Start Page: 815
End Page: 827
Document Type: Article
ID: 570147.0
Low-dose strain mapping by dark-field inline electron holography
Authors: Özdöl, V. B.; Koch, C. T.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2011
Name of Conference/Meeting: Microscopy and Microanalysis 2011
Title of Journal: Microscopy and Microanalysis
Volume (in Journal): 17, Suppl. 2
Start Page: 1228
End Page: 1229
Document Type: Conference-Paper
ID: 609590.0
Correlating the structural, chemical, and optical properties at nanometer resolution
Authors: Gu, L.; Özdöl, V. B.; Sigle, W.; Koch, C. T.; Srot, V.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2010-01
Title of Journal: Journal of Applied Physics
Volume: 107
Sequence Number of Article: 013501
Document Type: Article
ID: 442463.0
An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices
Authors: Koch, C. T.; Özdöl, V. B.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Applied Physics Letters
Volume: 96
Sequence Number of Article: 091901
Document Type: Article
ID: 460305.0
Strain mapping of 45 nm MOSFET by dark-field inline electron holography
Authors: Özdöl, V. B.; Koch, C. T.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: Microscopy and Microanalysis 2010
Title of Journal: Microscopy and Microanalysis
Volume (in Journal): 16
Issue / Number: Suppl. 2
Start Page: 592
End Page: 593
Document Type: Conference-Paper
ID: 493457.0
A nondamaging electron microscopy approach to map In distribution in InGaN light-emitting diodes
Authors: Özdöl, V. B.; Koch, C. T.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Journal of Applied Physics
Volume: 108
Issue / Number: 5
Sequence Number of Article: 056103
Document Type: Article
ID: 508131.0
Strain measurements on Si/SiGe heterostructures using HRTEM
Authors: Özdöl, V. B.; Koch, C. T.; Phillipp, F.; van Aken, P. A.
Place of Publication: Graz
Publisher: Verlag der Technischen Universität Graz, Austria
Date of Publication (YYYY-MM-DD): 2009
Name of Conference/Meeting: MC2009, Microscopy Conference
Title of Proceedings: MC2009. Vol. 3: Materials Science
Start Page: 447
End Page: 448
Document Type: Conference-Paper
ID: 435834.0
Quantitative local strain analysis of Si/SiGe heterostructures using HRTEM
Authors: Özdöl, V. B.; Phillipp, F.; Kasper, E.; van Aken, P. A.
Place of Publication: Berlin [et al.]
Publisher: Springer
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: 14th European Microscopy Congress
Title of Proceedings: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods
Start Page: 141
End Page: 142
Document Type: Conference-Paper
ID: 376637.0
Chemical bonds in damaged and pristine low-κ materials: A comparative EELS study
Authors: Stegmann, H.; Özdöl, V. B.; Koch, C.; van Aken, P. A.; Engelmann, J.; Potapov, P.; Zschech, E.
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: Twelfth European Workshop on Materials for Advanced Metallization 2008 (MAM2008)
Title of Journal: Microelectronic Engineering
Volume (in Journal): 85
Start Page: 2169
End Page: 2171
Document Type: Conference-Paper
ID: 379416.0
Entries: 1-10  
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