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Electrostatic modification of infrared response in gated structures based on VO2
Authors: Qazilbash, M. M.; Li, Z. Q.; Podzorov, V.; Brehm, M.; Keilmann, F.; Chae, B. G.; Kim, H. T.; Basov, D. N.
Date of Publication (YYYY-MM-DD): 2008-06-16
Title of Journal: Applied Physics Letters
Volume: 92
Issue / Number: 24
Sequence Number of Article: 241906
Document Type: Article
ID: 367855.0
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