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Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications
Authors: Choi, P.; Cojocaru-Mirédin, O.; Abou-Ras, D.; Caballero, R.; Raabe, D.; Smentkowski, V.; Park, C. G.; Gu, G. H.; Mazumder, B.; Wong, M. H.; Hu, Y.-L.; Melo, T. P.; Speck, J. S.
Date of Publication (YYYY-MM-DD): 2012
Title of Journal: Microscopy Today
Volume: 20
Issue / Number: 3
Start Page: 18
End Page: 24
Document Type: Article
ID: 611054.0
Effect of Surface Free Energy on PDMS Transfer in Microcontact Printing and Its Application to ToF-SIMS to Probe Surface Energies
Authors: Yang, L.; Shirahata, N.; Saini, G.; Zhang, F.; Pei, L.; Asplund, M. C.; Kurth, D. G.; Ariga, K.; Sautter, K.; Nakanishi, T.; Smentkowski, V.; Linford, M. R.
Date of Publication (YYYY-MM-DD): 2009-05-19
Title of Journal: Langmuir
Volume: 25
Issue / Number: 10
Start Page: 5674
End Page: 5683
Document Type: Article
ID: 433067.0
 
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